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Fischerscope X-Ray XDV-SDD

The Fischerscope X-Ray XDV-SDD is a universally applicable energy-dispersive X-ray fluorescence measuring device. It is predestined for the measurement and analysis of very thin layers or small concentration values in trace analysis. With the high-precision programmable X/Y stage and the fast loading, it is optimally suited for automated sample measurement.

Typical applications are:

  • Analysis of thin and very thin coatings, e.g. gold/palladium layers of ≤ 0.1 µm.
  • Trace analysis on printed circuit boards according to RoHS and WEEE requirements
  • Gold analysis
  • Measurement of functional layers in the electronics and semiconductor industry
  • Determination of complex multilayer systems
  • Automated measurements e.g. in quality control

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